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FASTNR: An Efficient Fault Simulator for Linear and Nonlinear DC Circuits
[chapter]
2000
IFIP Advances in Information and Communication Technology
In this paper we describe the simulator FASTNR (FAST Newton-Raphson) where an efficient methodology for solving the faulty circuit equations, called FAult RUBber Stamps (FARUBS), is implemented. Its application to single fault simulation in linear and nonlinear circuits is reported. The efficient fault simulation in nonlinear DC circuits is due both to the development of original linearized Newton-Raphson models for electronic devices and to the simulation of fault values in a "continuation"
doi:10.1007/978-0-387-35498-9_24
fatcat:p4rluubfczeq7hspomownbxwwe