A limit study of local memory requirements using value reuse profiles

A.S. Huang, J.P. Shen
1995 Proceedings of the 28th Annual International Symposium on Microarchitecture  
Modern high-pe~ormance microprocessors are devoting more and more resources to the problem 1072-4451/95 $4,00 Q 1995 IEEE 71 Proceedings of MICRO-28
doi:10.1109/micro.1995.476814 dblp:conf/micro/HuangS95 fatcat:7a6ue5wxsnecloslginzh7zvoi