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Two methods for measuring the modulation transfer function (MTF) of a charge-coupled device (CCD) that are based on the generation of laser speckle are analyzed and compared. The method based on a single-slit aperture is a quick method, although the measurements are limited to values of less than the Nyquist frequency of the device. The double-slit method permits the measurement of values of as much as some 1.8 times the Nyquist frequency, although it is a slower method because of the necessitydoi:10.1364/ao.44.001543 pmid:15813255 fatcat:eiza7xgv4nf2lg4jl54f35aace