Total Ionizing Dose Mitigation by Means of Reconfigurable FPGA Computing

Farouk Smith, Sias Mostert
2007 IEEE Transactions on Nuclear Science  
Synopsis There is increasing use of commercial components in space technology and it is important to recognize that the space radiation environment poses the risk of permanent malfunction due to radiation. Therefore, the integrated circuits used for spacecraft electronics must be resistant to radiation. The effect of using the MOSFET device in a radiation environment is that the gate oxide becomes ionized by the dose it absorbs due to the radiation induced trapped charges in the gate-oxide. The
more » ... trapped charges in the gate-oxide generate additional space charge fields at the oxide-substrate interface. After a sufficient dose, a large positive charge builds up, having the same effect as if a positive voltage was applied to the gate terminal.
doi:10.1109/tns.2007.897402 fatcat:are7ncc555dc5kxbnx43cu6fs4