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Total Ionizing Dose Mitigation by Means of Reconfigurable FPGA Computing
2007
IEEE Transactions on Nuclear Science
Synopsis There is increasing use of commercial components in space technology and it is important to recognize that the space radiation environment poses the risk of permanent malfunction due to radiation. Therefore, the integrated circuits used for spacecraft electronics must be resistant to radiation. The effect of using the MOSFET device in a radiation environment is that the gate oxide becomes ionized by the dose it absorbs due to the radiation induced trapped charges in the gate-oxide. The
doi:10.1109/tns.2007.897402
fatcat:are7ncc555dc5kxbnx43cu6fs4