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Post-manufacturing ECC customization based on Orthogonal Latin Square codes and its application to ultra-low power caches
2010
2010 IEEE International Test Conference
The paper proposes the idea of implementing a general multi-bit error correcting code (ECC) based on Orthogonal Latin Square (OLS) Codes in on-chip hardware, but then selectively, on a chip-by-chip basis, using only a subset of the code's check bits (subset of the rows in its H-matrix) depending on the defect map for a particular chip. The defect map is obtained from a memory characterization test which identifies which cells are defective or marginal. The idea proposed here is that if a
doi:10.1109/test.2010.5699221
dblp:conf/itc/DattaT10
fatcat:rmujyvtj7jefno2cdbetta42rm