The object of research is the properties of binary matrix symmetry. The constructed model of a binary matrix enabled us to determine the measure of matrix symmetry. Entropy criteria are obtained on the basis of the symmetry measure, which allows us to rank objects, represented by binary structures, in the order of their preference, and to solve various optimization tasks. The use of the obtained results in the tasks concerned with test control of digital devices has been shown. The "black box"

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... s type model of a digital device was described. The tasks were solved, relating to optimizing the probability distribution of input signals during random testing of discrete devices. With the help of the generator of pseudo-random numbers, the tests were devised covering single faults, modeled as «stuck-at faults» and «bridging faults» at control points. The resulting entropy criteria allowed us to reduce the duration of control tests of digital devices. The experimental data analysis enables us to make a conclusion about the expediency of using the entropy criteria in the theory and practice of digital device testing.