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Design and Run-time Reliability at the Electronic System Level
2010
IPSJ Transactions on System LSI Design Methodology
The ongoing scaling of CMOS technology facilitates the design of systems with continuously increasing functionality but also raises the susceptibility of these systems to reliability issues. These can for example be caused by high power densities and temperatures. At the moment it is still possible to cope with the posed challenges in an affordable manner. But in the future, a combination of design and run-time measures will become necessary in order to guarantee that reliability guidelines are
doi:10.2197/ipsjtsldm.3.140
fatcat:rjyitucncvb4baj2hzjm5twg7u