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Properties of one-dimensional superconducting wires depend on physical processes with different characteristic lengths. To identify the process dominant in the critical regime we have studied trans- port properties of very narrow (9-20 nm) MoGe wires fabricated by advanced electron-beam lithography in wide range of lengths, 1-25 microns. We observed that the wires undergo a superconductor -insulator transition that is controlled by cross sectional area of a wire and possibly also by thedoi:10.1103/physrevlett.109.027002 pmid:23030196 fatcat:ddp4com3dbalvpjx6atsoduxqq