A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2017; you can also visit the original URL.
The file type is application/pdf
.
Post-silicon bug diagnosis with inconsistent executions
2011
2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)
The complexity of modern chips intensifies verification challenges, and an increasing share of this verification effort is shouldered by post-silicon validation. Focusing on the first silicon prototypes, post-silicon validation poses critical new challenges such as intermittent failures, where multiple executions of a same test do not yield a consistent outcome. These are often due to on-chip asynchronous events and electrical effects, leading to extremely time-consuming, if not unachievable,
doi:10.1109/iccad.2011.6105414
dblp:conf/iccad/DeOrioKB11
fatcat:bbzbb3jjkngfllw47dev6dvof4