Reliable Eye-Diagram Analysis of Data Links via Device Macromodels

I.S. Stievano, I.A. Maio, F.G. Canavero, C. Siviero
2006 IEEE Transactions on Advanced Packaging  
This paper addresses the impact of device macromodels on the accuracy of signal integrity and performance predictions for critical digital interconnecting systems. It exploits nonlinear parametric models for both single-ended and differential devices, including the effects of power supply fluctuations and receiver bit detection. The analysis demonstrates that the use of well-designed macromodels dramatically speeds up the simulation as well it preserves timing accuracy even for long bit
more » ... s. Index Terms-Circuit modeling, digital integrated circuits, electromagnetic compatibility, macromodeling, signal integrity, system identification. Igor S. Stievano (M'98) received the Laurea and Ph.D. degrees in electronic engineering from the Politecnico di Torino, Turin, Italy, in 1996 and in 2001, respectively. Currently, he is an Assistant Professor of circuit theory with the Dipartimento di Elettronica, Politecnico di Torino. His research interests are in the field of electromagnetic compatibility, where he works on the macromodeling of linear and nonlinear circuit elements with specific application to the behavioral characterization of digital integrated circuits and linear junctions for the assessment of signal integrity and electromagnetic compatibility effects.
doi:10.1109/tadvp.2005.862645 fatcat:h3hwabwnnrcztkjhgf3bdf4eni