A multiscale finite element simulation of piezoelectric materials using realistic crystal morphology

Y. Uetsuji, H. Kuramae, K. Tsuchiya, M. Kamlah
2011 Computational Methods and Experimental Measurements XV   unpublished
This paper presents the full components of macroscopic homogenized material properties and the microscopic localized response obtained through a multiscale finite element simulation using realistic crystal morphology. Crystal morphology analysis was performed to reveal microstructure and texture of a polycrystalline piezoelectric material. The insulative specimen of piezoelectric material was coated with a conductive layer of amorphous osmium to remove an electric charge, and crystal
more » ... crystal orientations were measured by means of electron backscatter diffraction. Then the obtained crystal orientations were applied to a multiscale finite element simulation based on homogenization theory.
doi:10.2495/cmem110531 fatcat:2v6po5klzjga5fc52bykmpefzu