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Computational Methods and Experimental Measurements XV
This paper presents the full components of macroscopic homogenized material properties and the microscopic localized response obtained through a multiscale finite element simulation using realistic crystal morphology. Crystal morphology analysis was performed to reveal microstructure and texture of a polycrystalline piezoelectric material. The insulative specimen of piezoelectric material was coated with a conductive layer of amorphous osmium to remove an electric charge, and crystaldoi:10.2495/cmem110531 fatcat:2v6po5klzjga5fc52bykmpefzu