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Conceptual Design and Demonstration of an Automatic System for Extracting Switching Loss and Creating Data Library of Power Semiconductors
2020
IEEE Open Journal of Power Electronics
A switching characterization (SC) test of power semiconductor devices (PSDs) gives us significant insight into the dynamic switching behavior of the device under various operating conditions. A double pulse test (DPT) is a widely used method for evaluating switching performance parameters of a PSD such as its switching losses, switching speed (di/dt, dv/dt), turn-on and turn-off times etc. The scientific information obtained from analysis of DPT results of a PSD helps in predicting its
doi:10.1109/ojpel.2020.3026896
fatcat:dugysi7kqnfufgjx4sgy6p5hna