Application of a Finite-Difference Modeling Scheme for Ultrasonic Defect Characterization [chapter]

P. P. van 't Veen, E. J. M. Giling, M. Lorenz, L. F. van der Wal
1993 Review of Progress in Quantitative Nondestructive Evaluation  
doi:10.1007/978-1-4615-2848-7_107 fatcat:wkjvjd2rx5gk7lfhpvm7bkcyq4