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We propose a method for extracting information on the technical effect from a patent document. The information on the technical effect extracted by our method is useful for generating patent maps (see e.g., Figure 1 .) automatically or analyzing the technical trend from patent documents. Our method extracts expressions containing the information on the technical effect by using frequent expressions and clue expressions effective for extracting them. The frequent expressions and clue expressionsdoi:10.1527/tjsai.24.531 fatcat:mybg2kziz5f7jaozdhze7mwi4y