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Scanning Electron Microscopy (SEM) Analysis and Hardness of Diffusion Bonded Titanium-Titanium and Titanium-Copper Plates with Static Force and without Interlayers
2017
Open Journal of Composite Materials
In the present research, commercially pure Ti (grade-2) has been diffusion bonded with Ti and Cu plate under static force without any interlayers. The diffusion bonded samples were tested for micro hardness and micro structural analysis through optical microscopy and SEM. It is found from the present investigation that the bonded zone is affected by the processing variables such as bonding time (1 -2 h), bonding force (250 N), bonding temperature (973 -1073 K) and surface roughness. Results of
doi:10.4236/ojcm.2017.72007
fatcat:ngqxbekhhngcxcyy5cqwjtdkfq