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1993 European Conference on Design Automation with the European Event in ASIC Design
We present a method for testing sequential circuits using weighted random sequences. The weights are stored and a weighted random sequence generator is used to produce the required test sequences during testing rather than storing the actual test sequences themselves. The generation of required weights is based on the dynamic scan algorithm, DYNASTEE. Experimental results demonstrate new tradeo s in test application time and in tester memory requirements, while maintaining 100% fault coverage of all target faults.doi:10.1109/edac.1993.386471 fatcat:rznzdu3gb5emrpsz7vyul7bzaa