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Improving the Accuracy of RF Alternate Test Using Multi-VDD Conditions: Application to Envelope-Based Test of LNAs
2011
2011 Asian Test Symposium
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This work demonstrates that multi-VDD conditions may be used to improve the accuracy of machine learning models, significantly decreasing the prediction error. The proposed technique has been successfully applied to a previous alternate test strategy for LNAs based on response envelope detection. A prototype has been developed to show its feasibility. The prototype consists of a low-power 2.4GHz LNA and a simple envelope detector, integrated in a 90nm CMOS technology. Postlayout simulation
doi:10.1109/ats.2011.15
dblp:conf/ats/AsianFLRH11
fatcat:5cgo7yf2lncbdmsiekoudju72q