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Inference for a Step-Stress Model With Competing Risks for Failure From the Generalized Exponential Distribution Under Type-I Censoring
2015
IEEE Transactions on Reliability
In a reliability experiment, accelerated life-testing allows higher-than-normal stress levels on test units. In a special class of accelerated life tests known as step-stress tests, the stress levels are increased at some pre-planned time points, allowing the experimenter to obtain information on the lifetime parameters more quickly than under normal operating conditions. Also, when a test unit fails, there are often several risk factors associated with the cause of failure (i.e., mechanical,
doi:10.1109/tr.2014.2336392
fatcat:2o4d3kgvrfgonhyj6wuvb4xko4