Path delay test compaction with process variation tolerance

S. Kajihara, M. Fukunaga, Xiaoqing Wen, T. Maeda, S. Hamada, Y. Sato
2005 Proceedings. 42nd Design Automation Conference, 2005.  
In this paper we propose a test compaction method for path delay faults in a logic circuit. The method generates a compact set of two-pattern tests for faults on long paths selected with a criterion. While the proposed method generates each two-pattern test for more than one fault in the target fault list as well as ordinary test compaction methods, secondary target faults are selected from the fault list such that many other faults, which may not be included in the fault list, are detected by
more » ... he test pattern. Even if faults on long paths in a manufactured circuit are not included in the fault list due to a process variation or noise, the compact test set would detect the longer untargeted faults, i.e., the test set has a noise or variation tolerant nature. Experimental results show that the proposed method can generate a compact test set and it detects longer untargeted path delay faults efficiently.
doi:10.1109/dac.2005.193933 fatcat:5djv262urvcvfjw5srlz7ppcxu