Modified March C-With Concurrency in Testing for Embedded Memory Applications

Muddapu Parvathi
2012 International Journal of VLSI Design & Communication Systems  
March algorithms are known for memory testing because March-based tests are all simple and possess good fault coverage hence they are the dominant test algorithms implemented in most modern memory BIST. As March algorithms are well known algorithms for testing embedded RAMS, out of which March Cis known for finding all SAF, SOF, CF. This March C-is used frequently in the industry also. The proposed march algorithm is modified march c-algorithm which uses concurrent technique. Using this
more » ... march c-algorithm the complexity is reduced to 8n as well as the test time is reduced greatly. Because of concurrency in testing the sequences the test results were observed in less time than the traditional March tests. This technique is applied for a memory of size 256x8 and can be extended to any memory size.
doi:10.5121/vlsic.2012.3504 fatcat:ozjnqyycpvd5jhwj7wuksmtani