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Modulated optical solid-state spectrometer applications in plasma diagnostics
1999
Review of Scientific Instruments
A new electro-optically modulated optical solid-state ͑MOSS͒ interferometer has been constructed for the measurement of the low order spectral moments of line emission from optically thin radiant media. The instrument, which is based on the principle of the Fourier transform spectrometer, is rugged, compact, and inexpensive and offers a number of advantages over conventional grating based spectrometers. Most importantly, by employing electro-optical path-length modulation techniques, the
doi:10.1063/1.1149468
fatcat:uknctpl42neypaobxgqe4geb2i