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A tomographic approach to inverse mie particle characterization from scattered light
2007
Optics Express
The problem of computing the internal electromagnetic field of a homogeneous sphere from the observation of its scattered light field is explored. Using empirical observations it shown that, to good approximation for low contrast objects, there is a simple Fourier relationship between a component of the internal E-field and the scattered light in a preferred plane. Based on this relationship an empirical algorithm is proposed to construct a spherically symmetric particle of approximately the
doi:10.1364/oe.15.012217
pmid:19547589
fatcat:ukqlcquhrvdzrlkzb7zo2l6qly