Digital signal processor control of scanned probe microscopes

David R. Baselt, Steven M. Clark, Michael G. Youngquist, Charles F. Spence, John D. Baldeschwieler
1993 Review of Scientific Instruments  
Digital signal processors have made it possible to control scanned probe microscopes using straightforward software emulations of analog circuits. Using a system consisting of a commerciaIly available digital signal processor board interfaced to analog I/O, we have developed algorithms for self-optimizing feedback, raster generation (with hysteresis correction, sample tilt compensation, and scan rotation), lock-in detection, and automatic tip-sample approach. We also discuss an instruction
more » ... an instruction parser that takes advantage of the digital architecture to allow automatic operation for extended periods.
doi:10.1063/1.1144462 fatcat:ah4hv7uwjrdqfnav7g3sectgeq