Theoretical model of errors in micromirror-based three-dimensional particle tracking

Andrew J. Berglund, Matthew D. McMahon, Jabez J. McClelland, J. Alexander Liddle
2010 Optics Letters  
Several recently-developed particle-tracking and imaging methods achieve three-dimensional sensitivity through the introduction of angled micromirrors into the observation volume of an optical microscope. Here, we model the imaging response of such devices, and show how the direct and reflected images of a fluorescent particle are affected. In particle-tracking applications, asymmetric image degradation manifests itself as systematic tracking errors. Based on our results, we identify strategies
more » ... for reducing systematic errors to the 10 nm level in practical applications. PACS numbers:
doi:10.1364/ol.35.001905 pmid:20517457 fatcat:x3tnpbhflvbt7hdwxt5jvzcvcy