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An instrument for combining x-ray multiple diffraction and x-ray topographic imaging for examining crystal microcrystallography and perfection
2009
Review of Scientific Instruments
Preserved Fulltext
Diffraction imaging using x-ray topography ͑XRT͒ and x-ray multiple diffraction ͑XRMD͒ provide valuable tools for examining the growth defects in crystals and the distributions from ideal lattice symmetry ͑microcrystallography͒. The topographic x-ray multiple diffraction microprobe ͑TMDM͒ combines the complementary aspects of both techniques enabling XRT and XRMD studies within the same instrument providing a useful resource for the structural characterization of materials that are not very
doi:10.1063/1.3103571
pmid:19334925
fatcat:r6evmqsyvjfbna3jxjojvl75wy