A Method for Evaluating MTF and Phase Structures of Photographic Materials

Klaus Biedermann, Stefan Johansson
1975 Japanese Journal of Applied Physics  
Using the Medipix3 detector for direct electron imaging in the range 60 keV to 200 keV in electron microscopy J.A. Mir, R. Plackett, I. Shipsey et al. -The conversion of phase structure of singular beams spreading in uniaxial crystal B Sokolenko, D Poletaev, A Rubass et al. -Photorefractive polymers for digital holographic optical storage
doi:10.7567/jjaps.14s1.241 fatcat:d2hodjgyureebdghxkxw5nkcnq