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Electron energy-loss spectroscopy (e.e.l.s.) performed with an electron microscope can be used to obtain plasmon spectra, near-edge fine structure and extended electron energy-loss fine structure (ex.e.l.f.s.), as well as to do chemical analysis on truly microscopic samples. However, the very strength of the electron-electron interaction gives rise to significant and sometimes predom inant plural scattering effects. To obtain consistent and reliable estim ates of the single scattering distridoi:10.1098/rspa.1985.0041 fatcat:m6m6nhdbindzdo2sv2sfnnklce