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Sub-Micron Particle Size Measurements Using Multi-Wavelength Polarized Lights(Thermal Engineering)
多波長偏光を用いたサブミクロン粒径計測(熱工学,内燃機関,動力など)
2010
TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series B
多波長偏光を用いたサブミクロン粒径計測(熱工学,内燃機関,動力など)
Feasibility of a newlydeveloped size determination method for sub − micrQn particles using rnulti − wavelength polarized lights is investigated , experimentally . According to the Mie ' s theory the polar 正 zation ratios of scattered 監 ights are calculated nurnerically , which is a function of the part 王 cle diameter , the refraction index , and the wavelength of the incident light . Polystyrene particles are used as the test particles , which are suspended in pur 伍 ed wa 亡 er . The arithmetjc
doi:10.1299/kikaib.76.770_1620
fatcat:vtyogbdeuzhdxokqdbfxecuda4