Electron microscopy and x-ray microanalysis are common techniques in many research, development and quality labs (Garratt-Reed and Bell, 2002; Goldstein et al., 2003). As systems become ever more automated, as well as easy to use, new applications for the use of these systems develop and expand. One such application is particle analysis. These "particles" might be small loose fragments that can be applied to a conductive adhesive or a filter, embedded in epoxy and polished, or they can be inclusions within collect an EDS spectrum.