Randomness-efficient low degree tests and short PCPs via epsilon-biased sets

Eli Ben-Sasson, Madhu Sudan, Salil Vadhan, Avi Wigderson
2003 Proceedings of the thirty-fifth ACM symposium on Theory of computing - STOC '03  
doi:10.1145/780542.780631 dblp:conf/stoc/Ben-SassonSVW03 fatcat:qmz4fxxu5rfrba6ehi7n3bfs2u