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FEI Titan 80-300 TEM
2016
Journal of large-scale research facilities JLSRF
Preserved Fulltext
The FEI Titan 80-300 TEM is a high-resolution transmission electron microscope equipped with a field emission gun and a corrector for the spherical aberration (C<sub>S</sub>) of the imaging lens system. The instrument is designed for the investigation of a wide range of solid state phenomena taking place on the atomic scale, which requires true atomic resolution capabilities. Under optimum optical settings of the image C<sub>S</sub>-corrector (CEOS CETCOR) the point-resolution is extended up to
doi:10.17815/jlsrf-2-66
fatcat:o5olsa6stfatvbyv4bhdmwrtjy