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MTO volume 4 issue 7 Cover and Back matter
1996
Microscopy Today
Preserved Fulltext
of precision equipment I ha I permits unprecedented resolution in 3-dimensioiial, subnanometev analysis of mic restructures. Featuring user-friendly operation and long-term stability, the JEM-2010F also offers: Serving Advanced Technology • Schottky Emission; High Current High Brighlness • High Probe Current: 0.5nm Probe with 100 pA Current • High Resolution: Information Limit 1.4A, Scherzer 1.9A • Holography: Option Available • STEM Resolution: D.2rrm Magnification: 8MX Discover the JEM-2010F
doi:10.1017/s1551929500060922
fatcat:76eqmdlojjecfmwx63j5cbofnu