Statistical analysis of spatial point patterns on deep seismic reflection data: a preliminary test

K. Vasudevan, S. Eckel, F. Fleischer, V. Schmidt, F.A. Cook
2007 Geophysical Journal International  
Spatial point patterns generated from bitmaps of images of processed reflection seismic profiles are analyzed to quantify the reflectivity patterns. The point process characteristics for two different regions of a deep seismic reflection profile in northwestern Canada demonstrate that in both cases the points are not randomly distributed and that the point pattern distribution is different between the regions. The cluster effects for small point pair distances are stronger for the region of
more » ... where there is strong sedimentary layering than for the region where the layering is less distinct. As a result, it appears that future developments in point pattern analysis may provide a new tool for analysing spatial variations in reflection data.
doi:10.1111/j.1365-246x.2007.03572.x fatcat:6foq3ffv6bd2nef7krjqcam4f4