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The electron range and x-ray production for a given beam energy and atomic number is one of the most valuable piece of information a microscopist must have before carrying out qualitative and quantitative analysis on heterogeneous samples in a scanning electron microscope (SEM). Initial experiments by Kanter & Sternglass  and Cosslett & Thomas  show that the electron range, when expressed in mass thickness units (ρR), depends only lightly on the atomic number (Z) of the material. However,doi:10.1017/s1431927602106155 fatcat:zwmhufufm5cofdufansrqxqfne