Frequency-dependent shot noise in single-electron devices

V. Talbo, J. Mateos, S. Retailleau, P. Dollfus, T. Gonzalez
2014 2014 International Workshop on Computational Electronics (IWCE)  
The simulation of a double-tunnel junction with the SENS simulator gives access to the frequency-dependent and static behavior of shot noise. The concept of basic paths in a multi-state process provides a clear interpretation of the noise regimes, and allows locating cut-offs in autocorrelation functions and spectral densities.
doi:10.1109/iwce.2014.6865843 fatcat:7lanhktzhjel3pgbuea5gvlshm