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A longitudinal-to-transverse mapping technique is proposed to measure the length and temporal profile of ultrashort electron bunches. In this scheme a special chicane and a radio-frequency deflecting cavity are used to transform the beam's longitudinal distribution into angular distribution which is further converted to transverse distribution after a parallel-to-point imaging beam line. With this technique, the temporal profile of the electron beam is exactly mapped to the transverse profile.doi:10.1103/physrevstab.13.094001 fatcat:gfaxallhubbmjcjmk4thusttey