A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2016; you can also visit the original URL.
The file type is
Digital Darkfield Analysis of Nanoparticle Defects
Microscopy and Microanalysis
Microscopists have done combined space and frequency decompositions optically since long before coining of the word "wavelet" , under the name "darkfield imaging"  . Now integrative views of lattice information in digital images yield new challenges for mathematical harmonic analysis  . Such challenges are illustrated by a series of notes [4-7] on the uses and shortcomings of "weakly convergent" Fourier transform window techniques. Here, we show how robust (if pedestrian) digitaldoi:10.1017/s1431927607077860 fatcat:6fpdyxjqofag5p7ud3wkab7auq