Digital Darkfield Analysis of Nanoparticle Defects

P Fraundorf, J Liu, E Mandell
2007 Microscopy and Microanalysis  
Microscopists have done combined space and frequency decompositions optically since long before coining of the word "wavelet" [1], under the name "darkfield imaging" [2] . Now integrative views of lattice information in digital images yield new challenges for mathematical harmonic analysis [3] . Such challenges are illustrated by a series of notes [4-7] on the uses and shortcomings of "weakly convergent" Fourier transform window techniques. Here, we show how robust (if pedestrian) digital
more » ... eld techniques help to characterize: (i) an Antimony-doped Tin Oxide nanoparticle screw dislocation, and (ii) twinning and strain in a gold decahedral twin.
doi:10.1017/s1431927607077860 fatcat:6fpdyxjqofag5p7ud3wkab7auq