Embedded pupil function recovery for Fourier ptychographic microscopy: erratum

Xiaoze Ou, Guoan Zheng, Changhuei Yang
2015 Optics Express  
In the original paper, the line width of the resolution target (which corresponds to half-pitch resolution) was used to characterize the resolution of our microscope system. However, we think that full-pitch resolution offers a better definition of the imaging system's resolution limit. In this erratum, we list specific sections from the manuscript that used halfpitch resolution and correct them accordingly.
doi:10.1364/oe.23.033027 pmid:26831971 fatcat:jita2ctja5gnrfjkwdxh5k2m2m