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Afterglow mode and the new micropulsed beam mode applied to an electron cyclotron resonance ion source
Review of Scientific Instruments
An increasing number of experiments in the field of low energy ion physics (< 25 keV/charge) requires pulsed beams of highly charged ions. Whereas for high-intensity beams (> µA) a pulsed beam chopper, installed downstream to the analyzing dipole, is used. For low-intensity beams (< 100 nA) the ion intensity delivered during the pulse may be increased by operating the ECR discharge in the afterglow mode . This method gives satisfactory results (ie average current during the beam pulse isdoi:10.1063/1.2812340 pmid:18315103 fatcat:i5sg2cplgzczrjwfpifnlu7zx4