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New and improved BIST diagnosis methods from combinatorial Group testing theory
2006
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
We examine the general problem of built-in-self-test (BIST) diagnosis in digital logic systems. The BIST diagnosis problem has applications that include identification of erroneous test vectors, faulty scan cells, and faulty items. We develop an abstract model of this problem and show a fundamental correspondence to the well-established subject of combinatorial group testing (CGT) (D. Du and F. K. Hwang, Combinatorial Group Testing and Its Applications, 1994). We exploit this new perspective to
doi:10.1109/tcad.2005.854635
fatcat:ppoi4x37rjc25fxt4u3apiw36u