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Accelerating the Feedback Loop in Scanning Probe Microscopes without Loss of Height Measurement Accuracy by Using Pixel Forecast Methods
2022
Journal of Applied Mathematics and Physics
Scanning probe microscopes (SPM) are limited in their speed of data acquisition by the mechanical stability of the scanner. Therefore many types of scanners have been developed to achieve a rigid setup while maintaining an acceptable image size. We have followed here a different path to accelerate data acquisition by improving the feedback loop to achieve the same SPM image quality in a shorter time. While the feedback loop in a scanning probe microscope typically starts to probe a new pixel
doi:10.4236/jamp.2022.104093
fatcat:y7cxh23fsvc4naieznxryoc6fu