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On Defect Oriented Testing for Hybrid CMOS/Memristor Memory
2011
2011 Asian Test Symposium
Hybrid CMOS/memristor memory (hybrid memory) technology is one of the emerging memory technologies potentially to replace conventional non-volatile flash memory. Existing research on such novel circuits focuses mainly on the integration between CMOS and non-CMOS, fabrication techniques and reliability improvement. However, research on defect analysis for yield and quality improvement is still in its infancy stage. This paper presents a framework of defect oriented testing in hybrid memory based
doi:10.1109/ats.2011.66
dblp:conf/ats/HaronHH11
fatcat:glz36dv5svdmtbw33w6a3jz6yi