Nine-coded compression technique with application to reduced pin-count testing and flexible on-chip decompression

M. Tehranipour, M. Nourani, K. Chakrabarty
Proceedings Design, Automation and Test in Europe Conference and Exhibition  
This paper presents a new test data compression technique based on a compression code that uses exactly nine codewords. In spite of its simplicity, it provides significant reduction in test data volume and test application time. In addition, the decompression logic is very small and independent of the precomputed test data set. Our technique leaves many don't-care bits unchanged in the compressed test set, and these bits can be filled randomly to detect non-modeled faults. The proposed
more » ... can be efficiently adopted for single-or multiple-scan chain designs to reduce test application time and pin requirement. Experimental results for ISCAS'89 benchmarks illustrate the flexibility and efficiency of the proposed technique.
doi:10.1109/date.2004.1269072 dblp:conf/date/TehranipourNC04 fatcat:h63ma3ipinddxf2kktbdh7x3ky