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Optical and structural properties of LaF_3 thin films
2007
Applied Optics
LaF 3 thin films of different thicknesses were deposited on CaF 2 (111) and silicon substrates at a relatively low substrate temperature of 150°C. Optical (transmittance, reflectance, refractive index, and extinction coefficient) and mechanical (morphology and crystalline structure) properties have been investigated and are discussed. It is shown that LaF 3 thin films deposited on CaF 2 (111) substrates are monocrystalline and have a bulklike dense structure. Furthermore, it is presented that
doi:10.1364/ao.47.00c157
pmid:18449239
fatcat:jpbsi2cosjaozfe3olbqy4fvxy