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Case Study on Failure Analysis of Electrostatic Discharge Damage of Semiconductor Devices
2017
DEStech Transactions on Engineering and Technology Research
Preserved Fulltext
The semiconductor device has been widely used in electromechanical products. Electrostatic discharge damage is an important reason for the failure of semiconductor devices, so the electrostatic discharge damage failure analysis plays an important role in determining the reasons for the failure of semiconductor devices and making rectification and improvement measures. Through collecting and analyzing cases of electrostatic discharge failure analysis, the main technology of electrostatic
doi:10.12783/dtetr/ismii2017/16679
fatcat:totfk36o6nee3a4qa7e5kx6oni