Reproducible lamella preparation for electron cryo-tomography by in-situ thickness estimation during fluorescence-guided FIB milling

Radim Skoupy, Daan B. Boltje, Jacob P. Hoogenboom, Arjen J. Jakobi
2022 Microscopy and Microanalysis  
doi:10.1017/s1431927622005049 fatcat:3r24wcdqfbcfraqlnmhannevxy