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In Situ X-Ray Absorption Spectroscopy Study of Sn Underpotential Deposition on Ni from Perchloric Acid
2014
Journal of the Electrochemical Society
In situ X-ray absorption spectroscopy (XAS) was applied to investigate the Sn underpotential deposition (UPD) on Ni surface from 0.2 M HClO 4 solution containing 10 −3 M Sn 2+ with relation to the inhibition effect of Sn on aqueous corrosion of Ni. The periodical emersion method under potentiostatic polarization, using the surface-roughened Ni plate (surface roughness S r = 78.3) as a working electrode was employed to detect sensitively the sub-monolayer coverage of Sn on Ni. The Sn K-edge
doi:10.1149/2.044404jes
fatcat:fcb3ugewfbhgrj65ixscnvxjyi