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2014 IEEE International Reliability Physics Symposium
We propose a method that prevents single event latchup (SEL) using deep P-well on P-substrate. To confirm the effectiveness of the proposed method, SEL and single event upset (SEU) are evaluated for three well configurations; double-well, ordinary triple-well and the proposed deep P-well on P-substrate. Neutron irradiation test shows that the proposed method achieves SEL prevention without SEU increase.doi:10.1109/irps.2014.6861175 fatcat:ltbv7b75dzahbohpqyprq4l3vy