Low-cost through silicon vias (TSVs) with wire-bonded metal cores and low capacitive substrate-coupling

A. C. Fischer, N. Roxhed, G. Stemme, F. Niklaus
2010 2010 IEEE 23rd International Conference on Micro Electro Mechanical Systems (MEMS)  
The three-dimensional (3D) integration of electronics and/or MEMS-based transducers is an emerging technology that vertically interconnects stacked dies using through silicon vias (TSVs). They enable the realization of devices with shorter signal lengths, smaller packages and lower parasitic capacitances, which can result in higher performance and lower costs. This paper presents a novel low-cost fabrication technique for metalfilled TSVs using bonded gold-wires as conductive path. In this
more » ... pt the wires are surrounded by polymer, which acts both as an electrical insulator causing low capacitive coupling towards the substrate and as a buffer for thermo-mechanical stress.
doi:10.1109/memsys.2010.5442460 fatcat:y5ij2te76rgvfists7yf7skrei