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A scalable macromodel for substrate noise coupling in heavily doped substrates has been developed. This model is simple since it requires only four parameters which can readily be extracted from a small number of device simulations or measurements. Once these parameters have been determined the model can be used for any spacing between the injection and sensing contacts and for different contact geometries. The scalability of the model with separation and width provides insight into substratedoi:10.1109/iccad.1999.810636 dblp:conf/iccad/SamavedamMF99 fatcat:xxphroo6nbfw5ffjm67aigf6fq